High Resolution SPM

The MultiMode V is a compact and very high resolution scanning probe microscopy system ideal for micro to atomic scale imaging activity. It has a flexible platform that enables microscopy of nanostructures in semiconductor, biological and polymer materials. It can produce very stable and low noise image of 0.3 Å in vertical dimension and can operate in fluid environment. The system is equipped with two scanners that allow scanning area of 10 µm x 10 µm x 2.5 µm(XYZ) and 125 µm x 125 µm x 5 µm (XYZ) and uses the advanced NanoScope IV controller, which is capable of high speed scanning (50 MHz sampling speed) and capturing high resolution images up to 5120 x 5120 pixel density. The available SPM modes are:

  • Tapping Mode Atomic Force Microscopy (AFM)
  • AFM in air and fluid environment
  • Contact and non-contact Mode AFM
  • Phase Imaging
  • Lateral Force Microscopy
  • Magnetic Force Microscopy
  • Force Modulation
  • Scanning Tunnelling Microscopy
  • Scanning Capacitance Microscopy
  • Conductive AFM
  • Scanning Spreading Resistance Microscopy
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