The Nanonics CryoView 2000 is the state-of-the-art low temperature scanning probe microscopy and device characterisation system. The system is designed to operate at temperature less than 10 K and vacuum pressure of 5 X 10-8 Torr. It uses liquid helium as the cryogen which is transferred to the cold finger to cool the sample. The SPM tip scanner can achieve 1 nm resolution and 0.02 nm resolution using the sample scanner in the x, y and z directions. The CryoView has an open optical architecture that allows transmission and reflection microscopy for opaque and transparent materials. To expand its characterisation and analytical capability, the CryoView is integrated to the inVia Raman spectrometer. The available SPM modes and spectroscopy operation are:
- Atomic Force Microscopy (AFM)
- Contact, non-contact and intermittent-contact Mode
- Phase Imaging
- Spreading Resistance and Conductive Microscopy
- Scanning Near Field Optical Microscopy
- Tip Enhanced Raman Spectroscopy
- Confocal Microscopy
- Confocal Raman Microscopy
- Far field and near field Raman micro-spectroscopy
- High speed surface strain and defect mapping
