A Jandel Four Point Probe System is available for resistivity measurements on wafers up to 8 inch (similar to v/d Pauw measurements). A large selection of analysers is available to connect to any of the above system or to stand alone devices. This includes an Agilent E4443A spectrum analyser, RF impedance analysers, high-frequency Capacitance-Voltage analysers, digital oscilloscopes, and signal generators.
